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Design and Performance of the ICON EUV Spectrograph
Authors:Martin M. Sirk  Eric J. Korpela  Yuzo Ishikawa  Jerry Edelstein  Edward H. Wishnow  Christopher Smith  Jeremy McCauley  Jason B. McPhate  James Curtis  Travis Curtis  Steven R. Gibson  Sharon Jelinsky  Jeffrey A. Lynn  Mario Marckwordt  Nathan Miller  Michael Raffanti  William Van Shourt  Andrew W. Stephan  Thomas J. Immel
Affiliation:1.Space Sciences Laboratory,University of California,Berkeley,USA;2.Lawrence Berkeley National Laboratory,Berkeley,USA;3.Naval Research Laboratory,Washington,USA
Abstract:
We present the design, implementation, and on-ground performance measurements of the Ionospheric Connection Explorer EUV spectrometer, ICON EUV, a wide field ((17^{circ}times 12^{circ})) extreme ultraviolet (EUV) imaging spectrograph designed to observe the lower ionosphere at tangent altitudes between 100 and 500 km. The primary targets of the spectrometer, which has a spectral range of 54–88 nm, are the Oii emission lines at 61.6 nm and 83.4 nm. Its design, using a single optical element, permits a 0 . ° 26 Open image in new window /></a></annotation-xml></semantics></math> imaging resolution perpendicular to the spectral dispersion direction with a large ((12^{circ} )) acceptance parallel to the dispersion direction while providing a slit-width dominated spectral resolution of (Rsim25) at 58.4 nm. Pre-flight calibration shows that the instrument has met all of the science performance requirements.</td>
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