首页 | 本学科首页   官方微博 | 高级检索  
     检索      

XP过程对软件缺陷影响分析
引用本文:王晓华,赵明.XP过程对软件缺陷影响分析[J].航天控制,2008,26(1):79-84.
作者姓名:王晓华  赵明
作者单位:1. 贵州大学可靠性工程中心,贵州,贵阳,550025;遵义医学院附属医院,贵州,遵义,563003
2. 贵州大学可靠性工程中心,贵州,贵阳,550025
摘    要:XP方法测试驱动和多版本发布的实践,决定了软件产品集成测试也是一个增量迭代的过程。用户使用测试对提高产品的可靠性有重要作用。本文探讨XP测试过程对软件缺陷的影响及其缺陷改正效率的度量。

关 键 词:XP过程  软件缺陷  MTBF  缺陷改正率
文章编号:1006-3242(2008)01-0079-06
修稿时间:2007年9月11日

The Software Defects Analysis Based on XP Process
Wang Xiaohua,Zhao Ming.The Software Defects Analysis Based on XP Process[J].Aerospace Control,2008,26(1):79-84.
Authors:Wang Xiaohua  Zhao Ming
Abstract:The effect of XP testing process to the defects of different function groups in different iteration periods is presented based on these practices of test-driven,multi-releases and usage testing of user.The amount of defects of different function groups in different iteration periods is estimated through analyzing the continuous testing process of XP project and the rising process of software product functionality,measuring the rate of correcting defects,and numerical simulation for XP process.The simulation results indicate that the number of defects of the core function groups in near zero.The research conclusion shows that XP process based on usage testing of user and iteration incremental development process is very effective for improving software reliability.
Keywords:XP process  Software defect  MTBF  Rate of correcting defects  Usage testing
本文献已被 CNKI 万方数据 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号