NOx羽烟引起的局部电离层电子密度扰动

通过空间飞行器抛出羽烟的球状近似，研究白天ＮＯ和ＮＯ２羽烟在Ｅ层的扩散，光化学过程及它们对电子密度的影响。由于光致电离和郭解复合反应，抛出的ＮＯ羽烟在Ｅ层造成电子密度最大７．５倍的瞬时增加，而ＮＯ２羽烟可以使Ｅ层下部电子密度瞬时升高达２４倍。

ELECTRON DENSITY DISTURBANCE IN LOCAL IONOSPHERE CAUSED BY NOx EXHAUST PLUME

The diffusive and photochemical processes of NO and NO2 exhaust plumes in E layer during the daytime have been investigated and a spherical approximation is assumed for the plume diffusive process. NO exhaust plume in E layer causes a temporal 7.5-fold increase of electron density ne, while NO2 exhaust plume gives rise to a 24-fold increase of ne as a result of photo-ionization and dissociative recombination reactions. The chemical reactions between molecules and ions become more and more important in F layer and may lead to a temporal distinct decrease of ne after release of NO2 exhaust plume.