| 瓷介电容器老化对检测的影响 |
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| 引用本文： | 王琰,冯国颂.瓷介电容器老化对检测的影响[J].航空电子技术,2009,40(4). |
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| 作者姓名： | 王琰 冯国颂 |
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| 作者单位： | 1. 中国航空无线电电子研究所,上海,200233
2. 总参陆航部驻上海地区军事代表室,上海,200233 |
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| 摘 要： | 论述了瓷介电容器老化对检测的影响。对典型的X7R型瓷介电容器老化的分析,选择去老化的方法可以减少其对检测结果的影响。
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| 关 键 词： | 瓷介电容器 老化 检测 影响 |
The Effect of Aging on Testing |
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| WANG Yan,FENG Guo-song.The Effect of Aging on Testing[J].Avionics Technology,2009,40(4). |
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| Authors: | WANG Yan FENG Guo-song |
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| Institution: | WANG Yan1; FENG Guo-song2 (1.China National Aeronautical Radio Electronics Research Institute; Shanghai 200233; China; 2.Military Representative Office of the Headquarters of the General Staff in Shanghai Region; China); |
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| Abstract: | This paper introduces the effect of multilayer ceramic capacitors aging on testing.The multilayer ceramic capacitors dielectrics change with time result of testing difference.X7R dielectrics are a typical example.The aging process is reversible,and de-aging is usually sufficient to return the capacitor to its initial value,eliminating the effect of aging on testing. |
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| Keywords: | multilayer ceramic capacitors aging testing effect |
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