轴流叶片非接触式模态特性测试系统的开发与研究

基于涡轮螺旋桨发动机安装节拉杆系统，对各拉杆的受力状态进行分析，推导拉杆系统力学方程，并得到拉杆之间的力 学关系，结果显示各拉杆所受拉力比值为常数，该常数仅取决于拉杆的尺寸、安装角度、材料参数等。基于ANSYS Workbench 建立拉 杆系统有限元模型，对该系统进行静力学分析得到拉杆应变随拉力的变化关系,并得到不同拉杆拉力之间的关系，数值仿真结果与 理论分析结论相互印证。为基于安装节拉杆的涡桨发动机飞行拉力测量奠定技术基础。     

Nightside 135.6 nm emission enhancements of mid/low latitudes during geomagnetic storms as observed by the ionosphere PhotoMeter (IPM) on the Chinese meteorological satellite FY-3D

IPM has detected nightside 135.6 nm emission enhancements over a wide latitude range, from the sub-auroral latitudes to the equatorial regions during geomagnetic storms. Our work, presented in this paper, uses the data of IPM to understand these 135.6 nm emission enhancements during of geomagnetic storms and studies the variations of total electron content (TEC) and the F₂ layer peak electron density (NmF2) in the region of enhanced emissions. Middle and low latitude emission enhancements are presented during several medium storms in 2018. The variations of both the integrated electron content (IEC) derived from the nighttime OI 135.6 nm emission by IPM and TEC from the International GNSS Service (IGS) relative to the daily mean of magnetically quiet days of per each latitude bin (30°≦geographic latitude < 40°, 15°≦geographic latitude < 30°, 0°≦geographic latitude < 15°, ?15°≦geographic latitude < 0°, ?30°≦geographic latitude < -15°, ?40°≦geographic latitude < -30°) are investigated and show that on magnetically storm day, IEC by IPM always increases, while TEC from IGC may increase or decrease. Even if both increase, the increase of IEC is greater than that of TEC. From the comparison of IEC and TEC during magnetic storms, it can be seen that the enhancement of the nighttime 135.6 nm emissions is not entirely due to the ionospheric change. The time of IEC enhancements at each latitude bin is in good agreement, which mainly corresponds to the main phase time of the geomagnetic storm event and lasts until the recovery phase. The available ground-based ionosonde stations provide the values of NmF2 which match the 135.6 nm emissions measured by IPM in space and time. The variations of NmF2 squared can characterize the variations of the OI 135.6 nm emissions caused by O⁺ ions and electrons radiative recombination. The study results show that the OI 135.6 nm emission enhancements caused by O⁺ ions and electrons radiative recombination (where NmF2 squared increases) are obviously a contribution to the measured 135.6 nm emission enhancements by IPM. The contribution accounts for at least one of all contributions to the measured 135.6 nm emission enhancements by IPM. However, where the NmF2 squared provided by ionosonde decrease or change little (where the OI 135.6 nm emissions cause by O⁺ ions and electrons radiative recombination also decrease or change little), the emission enhancements measured by IPM at storm-time appear to come from the contributions of other mechanisms, such as energetic neutral atoms precipitation, or the mutual neutralization emission (O+ + O-→2O + h? (135.6 nm)) which also occupies a certain proportion in 135.6 nm airglow emission at night.     

2219 T852过渡环与T87箱筒段电子束焊接接头性能

基于贮箱用2219 T852整体过渡环与T87箱筒段的电子束环焊缝,开展了部段级电子束焊接接头常、低温力学性能测试,同时对焊接接头错缝量、断裂类型及金相组织进行了分析。研究结果表明:部段级常、低温2219 T852与T87电子束焊接接头的强度影响系数为0.63,低温状态下焊接接头的力学性能比室温状态下有所提高;错缝量与焊接接头力学性能成反比,其中对延伸率影响最为显著,低温有助于缓解错缝对焊接接头力学性能的弱化影响;电子束焊接接头组织不均匀性和结构形貌上的不连续性,特别是T852侧热影响区晶粒粗大,导致T852侧热影响区和焊缝接头根部为电子束焊缝的薄弱区域,焊接接头极易在该区域发生断裂。