Century scale solar variability imprinted in the 44Ti activity in meteorites.

The measurements of gamma-activity of the 44Ti (T1/2 = 66.6 years) produced by spallation reaction of galactic cosmic rays (GCR) in Alfianello, Olivenza, Rio Negro, Dhajala and Torino meteorites, which fell in the time interval 1883 AD (Alfianello)-1988 AD (Torino), show a century scale modulation, connected to long-term solar-wind flux variations in the interplanetary space. The variation of the 44Ti activity with the time of fall of meteorites is qualitatively consistent with the Gleissberg solar cycle, but the amplitude is three-four times higher than expected (about 5%) for GCR flux modulated by solar activity, as determined solely by the sunspot number. The cosmogenic 44Ti is a suitable radioisotope for this investigation, but its activity in meteorites is very low. We performed these measurements in the underground low level counting station of Monte dei Cappuccini in Torino, by means of a big hyperpure Ge crystal (approximately 2 kg) in selective coincidence with a heavy NaI (T1) scintillation detector (approximately 28 kg). This system allows a reliable and non destructive measurement of 44Ti (44Sc) in meteorites of 200-1200 g in weight. The background is about 1 count per day in the gamma-peak at 1157 keV of 44Sc in equilibrium with its parent 44Ti. The high stability of the performance allows long-lasting runs (approximately 10(7) s) in order to attain results with a standard deviation up to about 10%.     

Family of constrained signal detectors for hyperspectral imagery

Generalized likelihood ratio tests (GLRTs) are derived for the problem of detecting targets in hyperspectral images. These detectors are derived under the assumptions that the signals from the materials in the image mix linearly and that the noise in the system is Gaussian. It is also assumed that the abundances of the signals from the various materials in a pixel must sum to one. This constraint models the fact that the material abundances in a pixel are just the fraction of the pixel that they occupy. Under these assumptions, detectors are derived which outperform the detectors derived without the sum-to-one constraint.     

Nanotechnology-based molecular test equipment (MTE)

This paper describes original research efforts in the design, simulation, and development of nanotechnology-based molecular test equipment (MTE). This is a research effort for testing printed circuit boards independent of traditional automatic test equipment (ATE) through the fabrication of MTE within integrated circuits (ICs). The MTE is embedded within the IC substrate and encapsulated within nanoprobes that connect between the surface and the substrate of the IC at various functional areas. A process is followed whereby IC device simulation is performed to assess the electrical, chemical, and structural properties of integrated and adjacent substrate devices. Through this approach the nominal and failed device performance parameters of interest to substrate-based MTE are found. Discussion of the development and application of MTE within IC architectures is provided, including such topics as the effect of substrate composition on the design and realization of MTE, interfaces between MTE and IC devices, and reporting of MTE results to the IC surface and technician. Potential application areas within different device functions will also be identified. A chemical structure diagram is also provided to illustrate the implementation of MTE using discrete device configurations with MTE-augmented logic     

A large flat panel multifunction display for military and spaceapplications

A flat panel multifunction display (MFD) that offers the size and reliability benefits of liquid crystal display technology while achieving near-CRT display quality is presented. Display generation algorithms that provide exceptional display quality are being implemented in custom VLSI components to minimize MFD size. A high-performance processor converts user-specified display lists to graphics commands used by these components, resulting in high-speed updates of two-dimensional and three-dimensional images. The MFD uses the MIL-STD-1553B data bus for compatibility with virtually all avionics systems. The MFD can generate displays directly from display lists received from the MIL-STD-1553B bus. Complex formats can be stored in the MFD and displayed using parameters from the data bus. The MFD also accepts direct video input and performs special processing on this input to enhance image quality     

Aiming at a 1-cm Orbit for Low Earth Orbiters: Reduced-Dynamic and Kinematic Precise Orbit Determination

The computation of high-accuracy orbits is a prerequisite for the success of Low Earth Orbiter (LEO) missions such as CHAMP, GRACE and GOCE. The mission objectives of these satellites cannot be reached without computing orbits with an accuracy at the few cm level. Such a level of accuracy might be achieved with the techniques of reduced-dynamic and kinematic precise orbit determination (POD) assuming continuous Satellite-to-Satellite Tracking (SST) by the Global Positioning System (GPS). Both techniques have reached a high level of maturity and have been successfully applied to missions in the past, for example to TOPEX/POSEIDON (T/P), leading to (sub-)decimeter orbit accuracy. New LEO gravity missions are (to be) equipped with advanced GPS receivers promising to provide very high quality SST observations thereby opening the possibility for computing cm-level accuracy orbits. The computation of orbits at this accuracy level does not only require high-quality GPS receivers, but also advanced and demanding observation preprocessing and correction algorithms. Moreover, sophisticated parameter estimation schemes need to be adapted and extended to allow the computation of such orbits. Finally, reliable methods need to be employed for assessing the orbit quality and providing feedback to the different processing steps in the orbit computation process. This revised version was published online in August 2006 with corrections to the Cover Date.     

Role of BIT in support system maintenance and availability

The role of built in test (BIT) in electronic systems has grown in prominence with the advances in system complexity and concern over maintenance lifecycle costs of large systems. In an environment where standards drive system designs (and provide an avenue for focused advancement in technology), standards for BIT are very much in an evolutionary state. The reasons for advancing the effectiveness of BIT include reduced support overhead, greater, confidence in operation, and increased system availability. The cost of supporting military electronic systems (avionics, communications, and weapons systems) has driven much of the development in BIT technology. But what about the systems that support these end items that contain test and measurement instrumentation - such as automatic test equipment (ATE), simulators and avionics development suites? There has also been a beneficial effect on the maintenance and availability of these systems due to the infusion of BIT into their component assemblies. But the effect has been much more sporadic and fragmented. This paper looks at the state of BIT in test and measurement instruments, explain its affect on system readiness, and present ideas on how to improve BIT technologies and standards. This will not provide definitive answers to BIT development questions, since the factors that affect it are specific to the instrument itself. The topics covered in this paper are: definitions of built-in test, instrument BIT history, importance of BIT fault coverage and isolation in support systems, overview of BIT development process issues that limit the effectiveness of BIT Standards related to instrument BIT, making BIT more effective in support system maintenance and availability and conclusions.     

Chromosome instability of HPRT-mutant subclones induced by ionising radiation of various LET.

The induction of HPRT-mutations and survival of Chinese hamster cells (line B11ii-FAF28, clone 431) were studied after irradiation by 4He and 12C-ions of various LET (20-360 keV/micrometers), produced by the U-200 heavy ion accelerator. The RBE increases with LET up to the maximum at 100-200 keV/micrometers and then decreases. Cytogenetic analysis was performed on the HPRT-mutant subclones selected from unirradiated Chinese hamster V-79 cells and from HPRT-mutant subclones that arose after exposure to gamma-rays, 1 GeV protons and 14N-ions (LET-77 keV/micrometers), produced by the synchrophasotron and the U-400M heavy ion accelerator. Slow growing mutant subclones were observed. The cytogenetic properties of individual clones were highly heterogeneous and chromosome instability was observed in both spontaneous and radiation-induced mutants. Chromosome instability was highest among spontaneous mutants and decreased with increasing LET.     

Design of the TRIO system-on-chip for aerospace

Several design and testing aspects of the TRIO smart sensor data acquisition chip, developed by JHU/APL for NASA spacecraft applications are presented. TRIO includes a 10 bit self-corrected analog-to-digital converter (ADC), 16/32 analog inputs, a front end multiplexer with selectable aquisition time, a current source, memory, serial and parallel bus, and control logic. So far TRIO is used in many missions including Contour, Messenger, Stereo, Pluto, and the generic JPL X2000 spacecraft bus.