| XQR2V3000 FPGA单粒子翻转率在轨探测研究 |
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| 引用本文： | 韦欣荣,王金华,王颖,田金超.XQR2V3000 FPGA单粒子翻转率在轨探测研究[J].宇航学报,2019,40(6):719-724. |
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| 作者姓名： | 韦欣荣 王金华 王颖 田金超 |
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| 作者单位： | 1. 北京空间飞行器总体设计部，北京 100094；2. 北京卫星导航中心，北京 100094； 3. 北京遥测技术研究所，北京 100076 |
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| 基金项目： | 国家自然科学基金（11675013） |
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| 摘 要： | 通过搭载在某MEO、IGSO轨道卫星上的单粒子探测器对XQR2V3000 FPGA配置存储器进行了在轨单粒子翻转探测。利用一种基于复位计数统计的FPGA配置存储器单粒子翻转的监测方法，并对在2016年太阳活动平静期以及2017年9月6日太阳耀斑爆发期的2颗MEO卫星以及1颗IGSO卫星的XQR2V3000 FPGA配置存储器单粒子翻转次数进行统计，依据卫星轨道根数获得了翻转事件的空间分布。结果表明，在太阳平静期，设备等效铝屏蔽厚度为6 mm的情况下，处于MEO轨道和IGSO轨道的XQR2V3000配置存储器单粒子翻转率分别为 0.513 次/(器件·天)和0.491次/(器件·天)，分别为CREME96模型预测结果的22.4%和16.9%，两种轨道的翻转率相当。在太阳耀斑爆发期间，MEO与IGSO轨道单粒子翻转率分别上升为2.5次/(器件·天)和 5次/(器件·天) ，比平静期高了一个数量级。试验所得的单粒子翻转率可为相同轨道卫星电子设备单粒子翻转率的预示提供有效的参考。
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| 关 键 词： | XQR2V3000 配置存储器 单粒子翻转率 探测 |
| 收稿时间： | 2018-03-12 |
Research on Detection of SEU Rates of XQR2V3000 FPGA in Orbit |
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| WEI Xin rong,WANG Jin hua,WANG Ying,TIAN Jin chao.Research on Detection of SEU Rates of XQR2V3000 FPGA in Orbit[J].Journal of Astronautics,2019,40(6):719-724. |
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| Authors: | WEI Xin rong WANG Jin hua WANG Ying TIAN Jin chao |
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| Affiliation: | 1. Beijing Institute of Spacecraft System Engineering, Beijing 100094, China; 2. Beijing Satellite Navigation Center, Beijing 100094, China; 3. Beijing Research Institute of Telemetry, Beijing 100076, China |
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| Abstract: | The SEU detectors on some MEO and IGSO satellites are used to detect the single event upset (SEU) of the configuration memory of XQR2V3000 FPGA. The method based on the statistical number of reset to detect SEU is introduced. The statistical number of SEU of the configuration memory of the two MEO satellites and an IGSO satellite are given during the quiet periods of the solar activity in 2016 and during the solar flares burst on September 6, 2017. The spatial distribution of SEU is got according to the orbital elements. The results show that, in the quiet periods of the solar activity, the equivalent aluminum shielding thickness of the equipment is 6mm, the SEU rates of the configuration memory of FPGA in MEO and IGSO are respectively 0.513 upsets/(device·d) and 0.491 upsets/(device·d), about 22.4% of the prediction in MEO orbit and 16.9% of the prediction in IGSO orbit based on the CREME96 model, and the SEU rates of the two orbits are equivalent. During the solar flare eruption, the SEU rates of the configuration memory of FPGA in MEO and IGSO rise to 2.5 upsets/(device·d) and 5 upsets/(device·d) respectively. The SEU rate can provide an effective reference for the prediction of SEU rate of the satellite electronic equipment in the same orbit. |
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| Keywords: | XQR2V3000 Configuration memory SEU rate Detection |
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