Abstract: The single event effects of space-used SRAM-based FPGA are especially studied by using the heavy ion accelerator for a comprehensive SEE susceptibility assessment. The SEE sensitivity and the testing methods of different circuit resources are analyzed, as well as the characterizations of SEU, SEFI and SEL of various sensitive modules (CRAM, BRAM and Flip-flops). The results demonstrate the application ranges and the effectiveness of the testing methods in the SRAM FPGA SEE sensitivity assessment. The radiation-hardened FPGA exhibits the expected SEL resistance and the sensitivity to the SEU and the SEFI, and for the SEU, the FPGA performs worse in the static testing. The related testing methods and results may provide some guidance for the SEE test and the radiation design of similar devices.